Phi nano tof ii
Webb31 mars 2024 · The sputtering beam raster area given in the Table 2 was selected by performing the sputtering at different locations on the sample with the variation of the … Webbdepth is 242.5 nm as shown in Figure 1(ii) and total sputtering duration is 820 s. ToF-SIMS data acquisition To measure the secondary ion counts, the PHI nano ToF II TRIFT was used from Physical Electronics, MN, USA. In this process, a 10 ns pulsed liquid metal ion gun (LMIG) uses Gallium (Ga+) sources to produce ions as primary ion
Phi nano tof ii
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Webbimaging the distribution of both elements and molecules on the surface of materials. TOF-SIMS is the only mass spectrometry imaging technique that provides less than 70 nm spatial resolution with full mass range detection. The PHI nanoTOF II Parallel Imaging MS/MS platform has established itself as uniquely capable of providing superior analytical WebbTOF-SIMS具有超高表面灵敏度（~ 1 nm）和检测灵敏度（ppm-ppb级），以及极佳的质量分辨率和空间分辨率，可以检测包括H在内的所有元素和同位素，还可以提供膜层结构深度信息和三维重构（3D）信息，这些优势 ... PHI TOF-SIMS 用户成果赏析-北京理工大学先进材 …
Webb3. PHI nanoTOF II TOF-SIMS instrument (Physical Electronics, Minnesota, U.S.A.) equipped with a 30 kV Bi n q+ cluster liquid metal ion gun (LMIG), a precursor selection device, a collision cell, and a parallel linear time-of-flight tube suitable to perform tandem mass spectrometry. 1.2.3 The nanoTOF MS/MS instrument is controlled by SmartSoft Webbimaging the distribution of both elements and molecules on the surface of materials. TOF-SIMS is the only mass spectrometry imaging technique that provides less than 70 nm …
Webb8 mars 2024 · 提供 PHI NanoTOFII TOF-SIMS 飞行时间二次离子质谱仪的详细技术参数,资料和实时价格,厂家有专业的日本Ulvac-PhiPHI nanoTOF II销售和售后服务技术团队,日本Ulvac-Phi是分析仪器和实验室仪器设备专业 … WebbTOF-SIMS Depth profile: Depth profiling measurement was conducted on a Time-of-Flight Second Ion Mass Spectrometry instrument (TOF-SIMS, PHI nano TOF II, Physical …
Webb8 juni 2024 · phi nano tof ii 是phi第六代非常成功的tof-sims产品，是基于专利的 trift 分析仪设计技术。nano tof ii 独特的质谱仪对于痕量检测以及对带有纹理形貌的真实样品成像 …
Webb26 nov. 2024 · ToF-SIMS measurements were conducted with a PHI nano ToF II (ULVAC- PHI Inc., Chigasaki, Kanagawa, Japan), where a 30 kV Bi+pulsed primary ion beam was … chr tempWebb8 aug. 2024 · PHI nano TOF II仪器对锂离子电池能源材料、钙钛矿发光材料、光伏材料和阻燃材料等研究中起到了重要的测试支持，产出了众多高水平科研成果，至今已在Science … derogatory items definitionWebb5 nov. 2024 · Conclusions. A novel 2- (2,5-dimethoxyphenoxy)isoindoline-1,3-dione ( 3) was produced with 71% yield in the reaction between 1,4-dimethoxybenzene and N -hydroxyphthalimide under the action of manganese triacetate as the oxidant. The structure of the compound was confirmed by NMR spectroscopy, mass spectrometry, elemental … derogatory italian wopWebb1 sep. 2024 · Equipment: UL V AC-PHI, Inc, Equipment type: PHI nano TOF II. Each image had 512×512 pixels. TOF-SIMS depth profiling used 3 keV Ar + ion sputtering with an . … derogatory italian termsWebbULVAC-PHI 飞行时间型二次离子质谱仪PHI nano TOF II TRIFT 系列 . 三次聚焦分析仪适用于平面，不平整以及表面形貌复杂的样品，多种溅射离子枪实现三维成像的深度分 … chr thamsWebbDescription. PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The … derogatory italian nicknamesWebbPHI nano TOF: 仕様: 励起源（一次イオン照射系） ビスマスイオン銃 スパッタイオン銃 Arガスクラスターイオン銃（GCIB） 分析系 飛行時間型質量分析計、三重収束型静電 … chrt galgo